Microscopy, Atomic Force

"Microscopy, Atomic Force" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus, MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure, which enables searching at various levels of specificity.
MeSH information
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.


Publications
This graph shows the total number of publications written about "Microscopy, Atomic Force" by people in this website by year, and whether "Microscopy, Atomic Force" was a major or minor topic of these publications.
Bar chart showing 34 publications over 8 distinct years, with a maximum of 12 publications in 2017
To see the data from this visualization as text, click here.
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